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Sunday, July 12, 2020 | |||
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8:30am-9:30am | REGISTRATIONS | ||
TRACKS | TRACK 1 Session Chair: Sameer Chillarige | TRACK 2 Session Chair: Jais Abraham | TRACK 3 Session Chair: Shamitha Rao |
HALL NAME | Zoom Meeting | Zoom Meeting | Zoom Meeting |
9:30 am – 11:00 am (15 mins. Break) 11:15 am – 12:45 pm | T1: Digital Circuit Testing – A Tutorial for Beginners Prof. Indranil Sengupta (IIT, Kharagpur) | T2: Design and Consumption of IPs for Fail-Safe Automotive IC’s Nilanjan Mukherjee, Lee Harrison, Tom Waayers, Antonio Priore, Raghav Mehta (Mentor, a Siemens Business) | T3: Scan Test escapes, new fault models, and the growing need for functional system level tests Prof. Adit Singh (Auburn University) |
12:45pm-1:45pm | BREAK | ||
1:45 pm – 3:15 pm (15 mins. Break) 3:30 pm – 5:00 pm |
T4: Cost Effective DFT and Test for Embedded Analog Rubin Parekhji, Malav Shah (Texas Instruments) |
T5: Power-aware testing in the era of IOT Patrick GIRARD (LIRMM), Prof. Xiaoqing WEN (Kyushu Institute of Technology) | T6: Fast & Furious High Speed I/O (NRZ MHz to PAM4 GHz) and its ATE Challenges Jagadish Chandrasekaran, Srinivasan Chandrasekaran, Gowrishankar Ilankumaran (Tessolve) |