Date

July 21 – 23 , 2019

Location

@ The Leela Palace, Bengaluru

Paper Submissions

Closed (March 24, 2019)

Author Notification

May 13, 2019

Keynote Speakers

Janusz Rajski

Vice President of Engineering, Mentor - A Siemens Business.

Michael Campbell

Senior Vice President, Qualcomm

Amit Sanghani

Vice President, Test Automation Group, Synopsys

Rohit Kapur

Distinguished Engineer, Cadence

Kaushik Narayanun

Senior Director & Head of DFX Engineering, NVIDIA Corporation.

International Test Conference India 2019

About us

           International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for- test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.


           At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

Event Supporters

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Event Location

The Leela Palace, Bengaluru

Address:  23, HAL Old Airport Rd, HAL 2nd Stage, Kodihalli, Bengaluru, Karnataka 560008

Phone:  080-2521-1234

 

Contact Us

Contact us

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