Notification: "2021 IEEE International Test Conference India (ITC India) has been posted to the IEEE Xplore digital library effective 2021-09-16"

==== ====

Welcome to 5th Edition of IEEE International Test Conference - India

Thank you for a Successful ITC conference 2021!!

ITC India 2021 Best paper & 2 honourable selections:

  • Targeting Zero DPPM through Adoption of Advanced Fault Models and Unique Silicon Fall-out Analysis” presented at ITC India 2021 won the best paper award.
  • Addressing High Speed Memory Interface Test Quality Gaps in Shared Bus Architecture” presented at ITC India 2021 won the first Honorable Mention paper award.
  • A Novel Method to measure PLL Bandwidth in a 5G RF transceiver” presented at ITC India 2021 won the second Honorable Mention paper award.

Keynotes Videos

Keynote 1 - Amit Sanghani

Keynote 2 - Phil Nigh

VdoCipher: Something went wrong: cURL error 28: Resolving timed out after 5000 milliseconds

Video not found

Keynote 3 - Jeff Rearick

Keynote 4 - Vivek Chickermane

Keynote 5 - John Carulli


July 18-20 2021



Welcome to ITC Test Week India 2021

About Us

          International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for- test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.

           At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.