10th IEEE INTERNATIONAL TEST CONFERENCE INDIA
2026
JULY 19-21, 2026 | RADISSON BLU, MARATHAHALLI, BENGALURU
PANELS
Correlation Crisis in Semiconductor Test: Can AI Bridge the Gap?
Moderator: Sameer Chillarige
More details coming soon
India's Semiconductor Test Ecosystem: Growth story and Sustainability challenges
Moderator: Gaurav Bhargava
More details coming soon
Scaling DFT in the era of AI, HPCs, Chiplets - Are traditional DFT approaches efficient for MCMs and Chiplets?
Moderator: Kamlesh Pandey
More details coming soon