10th IEEE INTERNATIONAL TEST CONFERENCE INDIA
2026
JULY 19-21, 2026 | RADISSON BLU, MARATHAHALLI, BENGALURU
PANELS
Correlation Crisis in Semiconductor Test: Can AI Bridge the Gap?
Moderator: Sameer Chillarige (Cadence)
U
Udayakiran Yallamaraju
Qualcomm
J
John Schulze
AMD
C
C Jagadish Kumar
Intel
R
Raghu G G
Infineon
The Economics of Test: Where Should We Spend the Budget?
Panel Chair: Navin Bishnoi
Alpa Sood
Teradyne
Nilanjan Mukherjee
Siemens
Gowrisankar A.
Caliber Interconnects
Jeff Rearick
AMD
India's Semiconductor Test Ecosystem: Growth story and Sustainability challenges
Panel Chair: Gaurav Bhargava
Jayashree Saxena
Anora Labs
Jaynarayan T. Tudu
IIT Tirupati
Dr. Rubin Parekhji
Texas Instruments
Surya Musunuri
Infineon
Scaling DFT in the era of AI, HPCs, Chiplets - Are traditional DFT approaches efficient for MCMs and Chiplets?
Panel Chair: Kamlesh Pandey
Dr. Yervant Zorian
Synopsys
Dr. Shalini Pathak
STMicroelectronics
Rajesh Vaddempudi
Advantest
S
Srinivas Vooka