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| Sunday, July 21, 2024 | |||
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| 8:00am-9:30am | REGISTRATIONS | ||
| TRACKS |
TRACK 1 Session Chair | Prof. Jayagowri |
TRACK 2 Session Chair | Lakshmanan Balasubramanian |
TRACK 3 Session Chair | Bharath Nandakumar |
| HALL NAME | GRAND VICTORIA - A | GRAND VICTORIA - B | ARABICA & ROBUSTA |
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9:30 am - 11:00 am (15 mins. Break) 11:15 am - 12:45 pm |
Architecture & Methodology for DFT of Low Power SoCs Jais Abraham, Palkesh Jain, Nikhil Patil and Subhadip Kundu (Qualcomm) |
Functional Safety Readiness: Requirements in Design, Test and Application Prasanth Viswanathan Pillai and Rubin Parekhji (Texas Instruments) |
Optimal Scan Bandwidth Management and Structural Test Over High-Speed functional interfaces using Advanced Test Technologies Mohan Selvam, (MediaTek), Pooja Vishwanath (Synopsys), Greeshma Jayakumar (Synopsys), and Sri Ganta (Synopsys) |
| 12:45pm-1:45pm | LUNCH BREAK | ||
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1:45 pm - 3:15 pm (15 mins. Break) 3:30 pm - 5:00 pm |
Ensuring robust RTL for DFT: Comprehensive verification strategy Parth Kadiya, Piyushkumar Chaniyara, Mahipal Reddy, Satish Sajjanar and Pervez Garg (Texas Instruments) DFT Designer’s Nightmare in the Nanometer Age Ankush Srivastava (Qualcomm) and Kamlesh Pandey (Krivya Semicon) |
Addressing Test, Safety and Security for Connected Automotive IC’s Lee Harrison (Siemens EDA) Effective Low-Cost Strategies for Detecting Recycled Integrated circuits Ujjwal Guin (Auburn University) |
Fault Modeling in Digital Integrated Circuits: How It Influences ATPG and DFT Bhargab B. Bhattacharya and Susmita Sur-Kolay (Indian Statistical Institute, Kolkata) Synchronous Interface Test Challenges for Complex ASIC, Practical Solutions for At-Speed Test Veerabhadrarao Vasa and Vevekanenda G (Google) |
Conference Day 1
| Monday, July 22, 2024 | |||||
|---|---|---|---|---|---|
| 8:00am-9:15am | REGISTRATIONS | ||||
| 9:00 am-9:25 am | Inauguration/Welcome | Sameer Chillarige, General Co-Chair, ITC India 2024 | ||||
| 9:25 am-9:30 am | Special Guests Talk | ||||
| 9:30 am-10:15 am |
Keynote: "Evolution of Semiconductor Test – Going beyond traditional production screening", Sundarrajan Subramanian – VP Engineering, Design Management , Qualcomm |
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| 10:15 am-11:00 am |
Keynote: "In the Decade of AI, Expectations from the DFT Community: An Outsider's Perspective", Subash Chandar Govindarajan, Senior Director, Google Silicon, India |
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| 11:00 am-11:30 am | TEA/COFFEE BREAK SESSION | ||||
| SESSIONS |
Session 1 : In-Field Testing Session Chair | Sneha Revankar |
Session 2 : Advancements in ATPG Session Chair | Sunjiv Sachan |
Session 3 : DFT & Reliability Session Chair | Prof. Bhargab B. Bhattacharya |
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| HALL NAME | GRAND VICTORIA - A | GRAND VICTORIA - B | ARABICA & ROBUSTA | ||
| 11:30 am-01:00 pm |
1.1. Test Selection for Periodic In-field health-check monitoring in fail-safe applications Ravikumar CP 1.2 Concurrent Low Power Built-in Self-Test for Safety Critical SoCs Nitesh Mishra, Jemin Mehta, Hrithik Sahni and Ayushi Dixit 1.3 DSP-based Mutual Testing for Automotive and Industrial ICs Ravikumar CP |
2.1 An FPGA based Emulation of Source Synchronous Protocol-Aware Timing Stress Test P R R K Tirumalesu Manda, Vinodh J Rakesh, Vasavi Ghanta and Jagadish Raju Krishna Raju 2.2 Optimize Test Pattern Count via Efficient Operation of IEEE 1687 SIBs Divyank Mittal, Rajesh Khurana and Akanksha Bansal 2.3 Optimized Timing Aware ATPG for At-Speed Test of Cell Internal Faults Aneri Jain, Wilson Pradeep and Andreas Glowatz |
3.1 A Hybrid Test Point Insertion Strategy for Improved Test Metrics Nikita Naresh, Naushad Ali, Krunal Siddhapathak, Wilson Pradeep, Nilanjan Mukherjee, Oussama Laouamri and Karthick Prabhu D 3.2 Shift Power Reduction in High-Performance Clock Network Designs Kamlesh Bhesaniya, Omar Sharif Cherukur, Lakshmi Kandula, Ravishankar Chevuri, Pradeep Sreenivasa and Anoop Padmanabhan 3.3 Exploring Cross-Temperature Reliability in 3D NAND Through Layer-dependent Bit Error Analysis Anik Kumar Mondol and Biswajit Ray |
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| 01:00 pm-2:00 pm | LUNCH BREAK | ||||
| HALL NAME | GRAND VICTORIA | ||||
| 2:00 pm-2:45 pm |
Invited Talk: Test Challenges in AI and Chiplet Era,
Rajesh Vaddempudi, Tessolve |
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| 2:45 pm-3:30 pm |
Keynote: "From chip to system – The expanding world of test", Lee Harrison, Siemens |
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| 3:30pm-4:00pm | TEA/COFFEE BREAK SESSION | ||||
| SESSIONS |
Panel Discussion Session Chair | Kamlesh Pandey |
Poster Session Session Chair | Pranjal Giri |
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| HALL NAME | GRAND VICTORIA | ARABICA & ROBUSTA | |||
| 4:00 pm-5:30 pm |
"The role of AI in improving EDA tools and SOC test methodologies:
Opportunities and Challenges" Panelists: Prakash Narayan (Google) Krishna Chakravadhanula (Cadence) Navin Bishnoi (Marvell) Ruchir Dixit (Siemens EDA) Chandan Kumar (Synopsys) |
Poster Session | |||
Conference Day 2
| Tuesday, July 23, 2024 | ||||
|---|---|---|---|---|
| 8:00am-9:15am | REGISTRATIONS | |||
| 9:15am-9:30am | Welcome / Day 2 Summary | Venkata Rangam Totakura, General Co-Chair, ITC India 2024 | |||
| 9:30am-10:15am |
Keynote: "Fault-Criticality Classification and Test Solutions for Systolic Array-Based AI Hardware", Prof. Krishnendu Chakrabarty, Arizona State University |
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| 10:15am-11:00am |
Keynote: "Accelerated Compute's Impact on Test Development", Bill Cornwell - AVP, CCS (Custom, Compute & Storage) DFT , Marvell |
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| 11:00am-11:30am | TEA/COFFEE BREAK SESSION | |||
| SESSIONS |
Session 4 : Analog & Mixed Signal Test Session Chair | Dundapa Sankpal |
Session 5 : Emerging Technologies & Applications Session Chair | Vikram Kuralla |
Session 6 : Verification & Validation Methodologies Session Chair | Prakash Talawar |
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| HALL NAME | GRAND VICTORIA - A | GRAND VICTORIA - B | ARABICA & ROBUSTA | |
| 11:30am-01:00pm |
4.1 Application Specific Integrated Data Processing in ADCs for High Accuracy, Low Latency Advanced Real Time Control Systems Varshashree Kottadamane, Prasanth Viswanathan Pillai and Ibukun Olumuyiwa 4.2 Shift-Left Principle for Faster Post-Silicon Validation: LPDDR4 Controller Bring-up Vinodh J Rakesh, Jithesh Pothandy Karayi, Chaitanya Kumar Reddy Mallu, Karthick Somu, Vasavi Ghanta and Timmy E Peter 4.3 Silicon correlation in SLM: An Integrated Strategy for Chip performance optimization Abhishek Das, Durga Prasad Bade, Leela Krishna Thota and Akshay Kavukuntla |
5.1 On the Asymmetry of Stuck-at Fault Sensitivity in Memristive Neural Architectures Manobendra Nath Mondal, Animesh Basak Chowdhury, Santlal Prajapati, Susmita Sur-Kolay and Bhargab B. Bhattacharya 5.2 Application of Machine Learning in De-embedding of Signal Integrity Parameters for High Speed Serial Link Maneesh Pandey, Mohit Goyal and Ajay Dash 5.3 In-field fault detection framework for Edge Accelerator using Autoencoder R S Haripriya and Jaynarayan T Tudu |
6.1 LLM Assisted Assertion Generation for RTL Design Verification Bhabesh Mali, Maddala Karthik and Chandan Karfa 6.2 A Formal Based Verification Methodology for DFD Mux-Tree Hierarchies Maneesh Pandey, Madhav Lekkala, Nikhitha Chintagumpala, Bhagyalakshmi C and Surya Ramasamy 6.3 Accelerating First Silicon Validation By Leveraging FPGA Capabilities Jenish J Palathingal, Deepu K Krishnan, Sreeram V. R. and Divya D.S. |
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| 01:00pm-2:00pm | LUNCH BREAK | |||
| SESSIONS |
Industry Session - 1 Session Chair | Sandeep Jain |
Industry Session - 2 Session Chair | Mehala Balasundaram |
TRC Session Session Chair | Leela Thota |
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| HALL NAME | GRAND VICTORIA - A | GRAND VICTORIA - B | ARABICA & ROBUSTA | |
| 2:00pm-3:30pm |
1. "Navigating the complexities of test engineering", Mudasir Kawoosa, TI 2. "1687 Standard Extensions", Prasad Mantri, Eximietas Design 3. "Expedite time to market by optimizing the test program development cycle time using AI/ML algorithms, utilizing synthetic data generation", Kalyana Sundaram Chandran, Caliber Interconnects |
1. "Hierarchical Low Toggle ATPG", Ankush Srivastava, Qualcomm 2. "Targeting bridges and opens with physical defect-based approach", Suraj M C, Marvell 3. "Innovative Testing Strategies for the Future of Semiconductor Testing", Shitendra Bhattacharya, Emerson (formerly NI) |
1. "HTOL Controller –A Next Gen Stress methodology Coverage
analysis", Boopala Krishnan 2. "Synchronization of Master-Slave Embedded TAP controllers for IEEE 1687 based design configurations", Sagar Kumar, Divyank Mittal, Rajesh Khurana and Akanksha Bansal 3. "Test Method and Apparatus for Additive Jitter Correction in Mesh based Clock Architectures", Sudheer Anumala, Sri Sakthi Santhanam and Ankita Dhole, Intel 4. "Design and Development of In-Memory-Compute SRAM cell using 45nm Technology", Usha Mehta and Shubham Thaker |
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| 3:30pm-4:00pm | TEA/COFFEE BREAK SESSION | |||
| SESSIONS |
Industry Session - 3 Session Chair | Shamitha Rao |
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| HALL NAME | GRAND VICTORIA | |||
| 4:00pm-5:30pm |
1. "DFT and Silicon Health Optimization with AI driven test and Silicon Life Cycle Management", Mohammed Hussain, Synopsys 2. "Advances in a Shift-Left strategy for DFT", Nilanjan Mukherjee, Siemens 3. "Advancing Trustworthy Automotive Semiconductor Designs: Leveraging Modus and Midas", Pradeep Nagaraj, Cadence |
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| 5:30pm-5:45pm | Closing Ceremony | |||
Conference Location
Radisson Blu Hotel, Bengaluru , India. (Marathahalli, Outer Ring Road)
Address: 90/4 Outer Ring Road, Marathahalli, Bengaluru, 560037, India
Google Maps:
Click here for Direction
To Be Decided (TBD)