Important Dates :
✓ Submission deadline : 8th May, 2024 (Closed)
✓ Match notification : 15th June, 2024 (Completed)
✓ Submission deadline :
8th May, 2024 (Closed)
✓ Match notification :
15th June, 2024 (Completed)
International Test Conference, the world’s premier venue dedicated to the electronic test of devices, boards and systems, will host a dedicated Academia Research Track (ART) to manifest creative research ideas from students and young academicians. The key objective of this academia track, planned to be held with the International Test Conference, is to provide a dedicated informal forum for vigorous creative discussion and debate of this area from researchers of various academic institutes. The aim is to encourage the oral/poster presentation with discussion on truly innovative and “out-of-the-box” ideas that may not yet have been fully developed for presentation at reviewed conferences to address these challenges.
Students and young academicians are invited to submit original and high-quality research work or an innovative idea to this track. Selected ideas will interact with dedicated panel from industry to further extended the research work of common interests. ART is a platform of presenting late-breaking ideas, getting feedback on an innovative method, or participating without having to write a full paper.
One or two topic(s) from the topic list, or a description of your topic.
• An abstract of 35 words or less to be entered online.
• An electronic copy of an abstract up to 2 pages or an extended summary up to 3 pages, double-columned in IEEE Format (Paper template).
• Your submission must include the problem statement and novelty of solution(s). It should not include information that serves to identify the authors of the manuscript, such as name(s) or affiliation(s) of the author(s). References and bibliographic citations to the author(s) own published works or affiliations should be made in the third person.
Abstracts will be selected based on the novelty of the work and its relevance to the conference. The selected abstracts would be later either categorized into poster presentation or oral presentation, solely based on the merit.
Additional Benefits:
• Registration fee waiver and partial or full travel support will be provided through fellowship.
• Long term research plan with industry, if research interests align.
• High Impact Research award will be presented in conference banquet
ART Program Co-Chairs:
Research Mentorship Program for ITC Conference 2023 is live!
Become a Mentee
Last year, the 6th Edition of International Test Conference, India, for the first time, had provided a unique platform for master’s students, research scholars and post-docs to discuss novel research ideas, publication, funding advice and career opportunities from an established practitioner/Industrial liaison within their field. For the first time, ITC India had offered a “conference-sponsored Research Mentorship Program” to assist students in finding industrial liaisons and gain valuable insights on high-impact research ideas in the area of VLSI testing, Diagnosis and Reliability. Last year, more than 25 applications were received for this program. After proper scrutiny, 10 participants were benefited under this program and currently under the mentorship of industry professionals for their research activities. Continuing the same spirit, the 7th Edition of International Test Conference, India is inviting the applications from the aspirants of VLSI test field.
Why You Should Apply
How It Works
Additional Benefits
Note: If you have any questions or concerns, please do not hesitate to reach out via email at [email protected] or [email protected] or [email protected]
Radisson Blu Hotel, Bengaluru , India. (Marathahalli, Outer Ring Road)
Address: 90/4 Outer Ring Road, Marathahalli, Bengaluru, 560037, India
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To Be Decided (TBD)