Welcome to 5th Edition of IEEE International Test Conference - India
Thank you for a Successful ITC conference 2021!!
ITC India 2021 Best paper & 2 honourable selections:
Keynote 1 - Amit Sanghani
Keynote 2 - Phil Nigh
Keynote 3 - Jeff Rearick
Keynote 4 - Vivek Chickermane
Keynote 5 - John Carulli
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for- test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement.
At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.