Important Dates :
✓ Tutorial submission deadline : 27 Mar, 2022
✓ Author notification : 29 May, 2022
✓ Final manuscript due : 12 Jun, 2022
Introducing a shorter version of tutorials this year !
The Tutorials program at ITC India provides a spectacular platform to interact with industry veterans, gain in-depth understanding of topics from subject matter experts, honing problem-solving skills and challenge opinions. The ITC India conference is here to offer deep dive sessions on topics that range from the basics to the most advanced topics in the DFT world. The shorter version of tutorials , called ‘Tutorial TitBits’, is introduced to help reach greater depths of understanding , while the full versions cover the vastness of topics, thus reaching the breadth and depth of knowledge!
The Call For Tutorials for ITC Conference 2022 is live!
International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. This ITC India conference will be focusing on Test development in India but the submissions may not be limited to topics related to this region. Topics related to design and test development across multi geographical regions will be of special interest.
Authors are invited to submit original, high quality, practical and industry best practices as Tutorials describing recent work in the field of test and design.
Note: For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC India web site at http://www.itctestweekindia.org or email the program chair at [email protected]
Adaptive Test in Practice
ATE/Probe Card Design
Advances in Boundary Scan
Silicon Bring Up
Data Driven Methods
Data Exchange and Infrastructure
DFM and Test Diagnosis
Economics of Test
End-to-End Data Analysis
Embedded BIST & DFT
Emerging Defect Mechanisms
Hardware Security and Trust
Memory Test and Repair
Mixed-Signal and Analog Test
New Technologies and Test
On-Chip Test Compression
Pre- and Post- Silicon Validation
Power Issues in Test
Reliability and Resilience
Scan Based Test
Jitter, High-Speed I/O and RF Test
Simulation and Test
System Test (Applications)
System Test (Hardware/Software)
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Time Analysis and Reduction
Testing High Speed Optics/Photonics
Yield Analysis and Optimization