Call for Tutorials

Call for Submissions

Important Dates

Tutorials :

  • Tutorial Submission deadline :   15 April, 2021
  • Author Notification :    15 May, 2021
  • Final Manuscript Due :  15 June, 2021 

The Call For Tutorial for ITC Conference 2021 is live!

          International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, design-for-test, design-for-manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test, and yield professionals can confront challenges faced by the industry, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. This ITC India conference will be focusing on Test development in India but the submissions may not be limited to topics related to this region. Topics related to design and test development across multi geographical regions will be of special interest.

Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit high quality, practical, industry best practices. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected. Accepted full-length papers duly presented during the conference will be submitted for inclusion in IEEE Xplore online digital library and Scopus database.

Authors are also invited to submit a single-page poster proposal, double-columned in Format (template available in EasyChair). Posters are a useful way of presenting late-breaking results, getting feedback on an innovative method, or participating without having to write a full paper

Note:  For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC India web site at http://www.itctestweekindia.org or email the program chair at [email protected]

Submission must Include :

  • Tutorial Title.
  • An electronic copy of Tutorial program with a list of topics covered, a short description of each topic and the approximate time devoted to each topic. (About 2000 words)
  • The targeted audience and prerequisites. (About 50 words)
  • Tutorial duration should be 3:00 hours.
  • Name, Affiliation, E-mail address of each author.
  • Proposals will undergo a panel review process.
  • All presenters listed in the Tutorial proposal must be available for tutorial presentation.
  • Consent should be obtained from all the presenters and all organization involved in presenting the material before making the tutorial proposal.
  • Accepted tutorial abstracts will be published in conference proceedings.

 

ITC India invites submissions on the latest advances in test, validation and diagnosis of ICs, boards and systems

Topics of interest include (not limited to)

3D/2.5D Test

RF, mm-Wave and THz testing

Adaptive Test in Practice

ATE/Probe Card Design

Advances in Boundary Scan

Bring Up

Data Driven Methods

Data Exchange and Infrastructure

Defect-Oriented Testing

DFM and Test Diagnosis

Economics of Test

End-to-End Data Analysis

Embedded BIST & DFT

Emerging Defect Mechanisms

Hardware Security and Trust

IoT Testing

Known-Good-Die testing

Memory Test and Repair

MEMS Testing

Mixed-Signal and Analog Test

New Technologies and Test

On-Chip Test Compression

Online Test

Pre- and Post- Silicon Validation

Power Issues in Test

Protocol-aware Test

Reliability and Resilience

Scan Based Test

SoC/SiP/NoC Test

Silicon Debug

Jitter, High-Speed I/O and RF Test

Simulation and Test

System Test (Applications)

System Test (Hardware/Software)

Test-to-Design Feedback

Test Escape Analysis

Test Flow Optimizations

Test Generation and Validation

Test Resource Partitioning

Test Standards

Test Time Analysis and Reduction

Testing High Speed Optics/Photonics
Timing Test

Yield Analysis and Optimization