Notification: Closed for Submissions

Academia Research track

Call for Submissions

Important Dates

  • Tutorial Submission deadline : 13 june, 2021
  • Author Notification : 30 june, 2021
  • Final Manuscript Due : 10 july, 2021

Please note: We require the authors to follow this paper template:

The Call For Submission for Academia Research Track 2021 is live!

 Authors are invited to submit truly innovative and “out-of-the-box” ideas that may not yet have been fully developed for presentation at reviewed conferences to address design and test related challenges. The idea of is to manifest and publish creative research ideas from students and young academicians. The key objective of this track, for the first time planned to be held with the International Test Conference, is to provide a dedicated informal forum for vigorous creative discussion and debate of this area from researchers of various academic institutes. Please follow the submission guidelines as mentioned below.

Additional Benefits: Registration fee waiver will be provided through fellowship available at

Note:  For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC India web site at or email the program chair at [email protected]

Submission must Include :

  • One or two topic(s) from the below topic list, or a description of your topic.
  • An abstract of 35 words or less to be entered online.
  • An electronic copy of an abstract up to 2 pages or an extended summary up to 3 pages, double-columned in IEEE Format (Paper template)
  • Your submission must include the problem statement and novelty of solution(s). It should not include information that serves to identify the authors of the manuscript, such as name(s) or affiliation(s) of the author(s). References and bibliographic citations to the author(s) own published works or affiliations should be made in the third person.

ITC India invites submissions from students, young researchers and academicians to publish their novel ideas on the latest advances in test, verification, diagnosis of ICs, boards and systems.

Topics of interest include (not limited to)

3D/2.5D Test

RF, mm-Wave and THz testing

Adaptive Test in Practice

ATE/Probe Card Design

Advances in Boundary Scan

Bring Up

Data Driven Methods

Data Exchange and Infrastructure

Defect-Oriented Testing

DFM and Test Diagnosis

Economics of Test

End-to-End Data Analysis

Embedded BIST & DFT

Emerging Defect Mechanisms

Hardware Security and Trust

IoT Testing

Known-Good-Die testing

Memory Test and Repair

MEMS Testing

Mixed-Signal and Analog Test

New Technologies and Test

On-Chip Test Compression

Online Test

Pre- and Post- Silicon Validation

Power Issues in Test

Protocol-aware Test

Reliability and Resilience

Scan Based Test

SoC/SiP/NoC Test

Silicon Debug

Jitter, High-Speed I/O and RF Test

Simulation and Test

System Test (Applications)

System Test (Hardware/Software)

Test-to-Design Feedback

Test Escape Analysis

Test Flow Optimizations

Test Generation and Validation

Test Resource Partitioning

Test Standards

Test Time Analysis and Reduction

Testing High Speed Optics/Photonics
Timing Test

Yield Analysis and Optimization