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Call for Papers

*The Deadlines for Call For Papers have been updated*

The International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, design for test, design for manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test and yield professionals can confront challenges faced by the industry and learn how these challenges are being addressed by the combined effort of academia, design tool and equipment suppliers, designers and test engineers. This ITC India conference will be focusing on Test technology development in India, but the submissions may not be limited to topics related to this region. Topics related to DFT and test development across geographical regions will be of special interest.

Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit high quality, practical, industry best practices. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.

 

Note: For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself email program chair at [email protected]  and for any other general question email us at  [email protected]

Submissions must include:

  • Title of paper.
  • Name, affiliation, e-mail address of each author.
  • The corresponding author(s). ITC will communicate with the corresponding author(s).
  • One or two topic(s) from the topic list, or a description of your topic.
  • An electronic pdf copy of a complete paper up to 10 pages , or an extended summary up to 6 pages. Submissions less than 4 pages are rarely accepted.
  • An abstract of 200 words or less to be entered online.

Submit your Paper online at https://easychair.org/conferences/?conf=itcindia2019

Important Dates:

  1. Abstract deadline: Feb 22, 2019.  Mar 8, 2019
  2. Paper Submission deadline : Mar 1, 2019.  Mar 15, 2019. Mar 24, 2019
  3. Author Notification : Apr 26, 2019.   May 3, 2019.  May 13, 2019
  4. Final Manuscript Due : Jun 10, 2019. June 17, 2019

ITC India invites submissions on the latest advances in test, validation and diagnosis of ICs, boards and systems.

 

Topics of interest include (not limited to):

3D/2.5D Test

Adaptive Test in Practice

ATE/Probe Card Design

Advances in Boundary Scan

Bring Up

Defect-Oriented Testing

DFM and Test Diagnosis

Economics of Test

End-to- End Data Analysis

Embedded BIST & DFT

Emerging Defect Mechanisms

Hardware Security and Trust

IoT Testing

Known-Good- Die testing

On-Chip Test Compression

Memory Test and Repair

MEMS Testing

Mixed-Signal and Analog Test

New Technologies and Test

Online Test

Pre & Post- Silicon Validation

Power Issues in Test

Protocol-aware Test

Reliability and Resilience

Scan Based Test

SoC/SiP/NoC Test

Silicon Debug

Jitter, High-Speed I/O & RF Test

Reliability

Simulation and Test

System Test (Applications)

System Test (Hardware/Software)

Test-to- Design Feedback

Test Escape Analysis

Test Flow Optimizations

Test Generation and Validation

Test Resource Partitioning

Test Standards

Test Time Analysis and Reduction

Testing High Speed Optics/Photonics

Timing Test

Yield Analysis and Optimization

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