Call for Papers
*The Deadlines for Call For Papers have been updated*
The International Test Conference is the world’s premier venue dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, design for test, design for manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test and yield professionals can confront challenges faced by the industry and learn how these challenges are being addressed by the combined effort of academia, design tool and equipment suppliers, designers and test engineers. This ITC India conference will be focusing on Test technology development in India, but the submissions may not be limited to topics related to this region. Topics related to DFT and test development across geographical regions will be of special interest.
Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit high quality, practical, industry best practices. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.
Note: For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself email program chair at [email protected] and for any other general question email us at [email protected]
Submissions must include:
- Title of paper.
- Name, affiliation, e-mail address of each author.
- The corresponding author(s). ITC will communicate with the corresponding author(s).
- One or two topic(s) from the topic list, or a description of your topic.
- An electronic pdf copy of a complete paper up to 10 pages , or an extended summary up to 6 pages. Submissions less than 4 pages are rarely accepted.
- An abstract of 200 words or less to be entered online.
Submit your Paper online at https://easychair.org/conferences/?conf=itcindia2019
Important Dates:
- Abstract deadline:
Feb 22, 2019. Mar 8, 2019 - Paper Submission deadline :
Mar 1, 2019.Mar 15, 2019.Mar 24, 2019 - Author Notification :
Apr 26, 2019.May 3, 2019.May 13, 2019 - Final Manuscript Due :
Jun 10, 2019.June 17, 2019
ITC India invites submissions on the latest advances in test, validation and diagnosis of ICs, boards and systems.
Topics of interest include (not limited to):
3D/2.5D Test
Adaptive Test in Practice
ATE/Probe Card Design
Advances in Boundary Scan
Bring Up
Defect-Oriented Testing
DFM and Test Diagnosis
Economics of Test
End-to- End Data Analysis
Embedded BIST & DFT
Emerging Defect Mechanisms
Hardware Security and Trust
IoT Testing
Known-Good- Die testing
On-Chip Test Compression
Memory Test and Repair
MEMS Testing
Mixed-Signal and Analog Test
New Technologies and Test
Online Test
Pre & Post- Silicon Validation
Power Issues in Test
Protocol-aware Test
Reliability and Resilience
Scan Based Test
SoC/SiP/NoC Test
Silicon Debug
Jitter, High-Speed I/O & RF Test
Reliability
Simulation and Test
System Test (Applications)
System Test (Hardware/Software)
Test-to- Design Feedback
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Test Time Analysis and Reduction
Testing High Speed Optics/Photonics
Timing Test
Yield Analysis and Optimization