Why Attend?

The International Test Conference is the world's premier venue dedicated to the electronic test of devices, boards and systems - covering the complete cycle from design verification, design for test, design for manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. At ITC India, design, test and yield professionals can confront challenges faced by the industry and learn how these challenges are being addressed by the combined effort of academia, design tool and equipment suppliers, designers and test engineers. This ITC India conference will be focusing on Test technology development in India, but the submissions may not be limited to topics related to this region. Topics related to DFT and test development across geographical regions will be of special interest.

Conference Highlights

Keynotes from Global Technical Experts in the Test arena
6 Tutorials from Industry/Academia (Day 1)
2 days of Technical Program (8 sessions, 24 papers)
Panel discussion, Demo, Booth/Exhibits and Networking

Sessions on emerging test needs for Artificial intelligence, Automotive and IoT, Hardware security, System test, Analog and mixed signal test, Yield learning, Test analytics, Test methodology, Benchmarks, Test standards, Memory and 3D test, Diagnosis, DFT architectures, Functional and software-based test.

All above are covered through simple registration of Tutorials only, Conference only or both. Come Learn, Share and Network!

On behalf of the 2018 ITC India steering committee, program committee and dedicated volunteers, who are key to making the program complete, we welcome you to this year's exciting technical program and exhibits.

Navin Bishnoi

General Chair, ITC India 2018