International Test Conference (INDIA) 2018 - Summary

It was great to host test community in Bangalore, Silicon Valley of India. After the success of 1st edition, ITC India was looked forward as platform for technical exchange. With the help of volunteers, ITC India Steering committee had assembled a rich program.

2nd edition of ITC India was held on July 22-24, 2018 at Bangalore.

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Here is a brief highlight:

6 Tutorials from Industry/Academia (Day 1)

Covering Automotive Test, Machine Learning, Analog Fault Simulation, Test Access Mechanisms, System Test and Logic Encryption
36+ hours sessions, 600+ pages slides, 240+ attendees
1 TTTC Vs 5 invited/reviewed, 2 Academia vs 4 Industry

4 Keynotes from Global Technical Experts in the Test arena (Day 2 & 3)

Infrastructure IP for Today’s Automotive SOCs - Yervant Zorian (Fellow, Synopsys)
Testing in Always on Era - Raja Manickam (CEO, Tessolve)
Self-Driving Cars – how they are pushing the boundaries of IC Testing - Nilanjan Mukherjee, (Engineering Director, Mentor Graphics)
Directions in Advanced Packaging Technology - Ravi Mahajan (Fellow, Intel)

2 Days of Technical Program (Day 2 & 3)

8 sessions, 23 papers, 18 selected vs 5 invited
350+ attendees - 35 faculty members, 85 students and 230 industry participants
Sessions Title: Memory Test & Repair, Debug & Diagnosis, Automotive Test, Mixed Signal & Analog Test, DFT Architecture, Test Challenges, Test Potpourri, Standards

Panel discussion

Title: "Fault tolerance or fault intolerance: what's the way forward?"
7 experts across industry, academia

Demo, Booth/Exhibits

10 booths/exhibits covering EDA, design, test and equipment company
2 demos by Advantest
1 special talk by Advantest on 5G

Networking

Networking Dinner for all attendees and leaders/executives from corporate, including fun event “Improv show”

Sessions covered topics of emerging test needs for Artificial intelligence, Automotive and IoT, Hardware security, System test, Analog and mixed signal test, Yield learning, Test analytics, Test methodology, Benchmarks, Test standards, Memory and 3D test, Diagnosis, DFT architectures, Functional and software based test.

Technical Program Committee along with Review members and Sessions chairs chose and announced below awards. These papers will be included in ITC US program, as part of ITC India special session.

Best Paper : Improved RAM Sequential Tests for SoCs with Complex Memory Architectures by Wilson Pradeep, Prakash Narayanan

Honorable Mention Paper : High Accuracy, Robust Multiple Defect Diagnosis Scheme by Bharath Nandakumar, Anil Malik, Sameer Chillarige, Anshul Kumar, Joe Swenton, Atul Chhabra

Honorable Mention Paper : Enhancing Automotive Self-Test with Embedded Distributed Programming by Carl Wisnesky II, Patrick Gallagher

Conference was financially supported by 11 companies. We also had support from IEEE Bangalore Section and IESA (Indian Electronics Semiconductor Association). We provided Fellowship participants which included complimentary registration and transport reimbursement, to Academia and was being utilized by 110+ students/faculty.

We announced the formation of TTTC India chapter and the plans to start on other initiatives (workshop, education) for test community, in partnership with IEEE. TTTC’s goals are to contribute to members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art.

Attendees didn’t have to worry about missing any events. We had the ITC mobile app for users to manage their schedule as well as fill survey. ITC India had media coverage with interviews as well as coverage of Keynotes and Panel Discussion. See http://itctestweekindia.org/media_coverage.html to read the articles.

We had 20 member Organizing team (volunteers from industry and academia), who ensured that the 2nd edition is bigger and better than previous.

Together, we learnt to create (and test) a better TOMORROW !

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Navin Bishnoi,
General Co-Chair, ITC India 2018