Improved RAM Sequential Tests for SoCs with Complex Memory Architectures
Wilson Pradeep, Texas Instruments
Wilson Pradeep, Texas Instruments
Prakash Narayanan, Texas Instruments
BEST PAPER AWARDS
Honorable Mention Paper – 1
High Accuracy, Robust Multiple Defect Diagnosis Scheme
Bharath Nandakumar, Cadence Design Systems
Bharath Nandakumar, Cadence Design Systems
Anil Malik, Cadence Design Systems
Sameer Chillarige, Cadence Design Systems
Anshul Kumar, IIT, Delhi
Joe Swenton, Cadence Design Systems
Atul Chhabra, Cadence Design Systems
Honorable Mention Paper – 2
High Accuracy, Robust Multiple Defect Diagnosis Scheme
Puneet Arora, Cadence Design Systems
Carl Wisneskey II, Cadence Design Systems
Patrick Gallagher, Cadence Design Systems