Call for Tutorials

Authors are invited to submit original, high quality, practical and industry best practices as Tutorials describing recent work in the field of test and design.

Tutorial title
An electronic copy of a Tutorial program with a list of topics covered, a short description of each topic and the approximate time devoted to each topic (about 2000 words)
The targeted audience and prerequisites (about 50 words)
Tutorial duration should be 3:00 hours
Name, affiliation, e-mail address of each author
Proposals will undergo a panel review process
All presenters listed in the tutorial proposal must be available for tutorial presentation
Consent should be obtained from all the presenters and all organizations involved in presenting the material before making the tutorial proposal
Accepted tutorial abstracts will be published in conference proceedings

IMPORTANT DATES

Tutorial Submission deadline : 10 Mar, 2019
Author Notification : 10 May, 2019
Final Manuscript Due : 10 June, 2019

ITC India invites submissions on the latest advances in test, validation and diagnosis of ICs, boards and systems.

Topics of interest include (not limited to):

3D/2.5D Test

Adaptive Test in Practice

ATE/Probe Card Design

Automotive

A.I.

Advances in Boundary Scan

Silicon Bring Up

Data Driven Methods

Data Exchange and Infrastructure

Defect-Oriented Testing

DFM and Test Diagnosis

Economics of Test

End-to-End Data Analysis

Embedded BIST & DFT

Emerging Defect Mechanisms

Hardware Security and Trust

IoT Testing

Known-Good-Die testing

Memory Test and Repair

MEMS Testing

Mixed-Signal and Analog Test

New Technologies and Test

On-Chip Test Compression

Online Test

Pre- and Post- Silicon Validation

Power Issues in Test

Protocol-aware Test

Reliability and Resilience

Scan Based Test

Security

SoC/SiP/NoC Test>

Silicon Debug>

Jitter, High-Speed I/O and RF Test>

Simulation and Test>

System Test (Applications)>

System Test (Hardware/Software)>

Test-to-Design Feedback>

Test Escape Analysis>

Test Flow Optimizations>

Test Generation and Validation>

Test Resource Partitioning>

Test Standards>

Test Time Analysis and Reduction>

Testing High Speed Optics/Photonics>

Yield Analysis and Optimization>

For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC India web site at http://www.itctestweekindia.org or email the program chair at itc-india-tpc@googlegroups.com