Tutorial #1

Testing, Tuning and Built-in Self-Adaptation Techniques for Mixed Signal/RF Circuits and Systems

Prof. Abhijit Chatterjee, Georgia Tech

Tutorial #2

Adaptive Test Methods Targeting "Zero Defect" IC Quality and Reliability

Prof. Adit Singh, Auburn University

Tutorial #3

DFT for Low Power Designs: Challenges & Solutions

Jais Abraham, Arvind Jain, Dr.Nilanjan Mukherjee, Shamitha Rao

Tutorial #4

Test and Productization of IOT

Jagdish Kumar. C, Srinivasan. C, Gowri Shankar I, Tessolve Semiconductor Engineering Services

Tutorial #5

Practical Aspects of a Layout Aware Volume Diagnosis Methodology

Sameer Chillarige, Sharjinder Singh, Cadence Design Systems

Tutorial #6

Challenges in Testability for Security: A State-of-the-Art Perspective

Prof. Debdeep Mukhopadhyay, IIT Kharagpur, NTU Singapore


Contact Details

Organizing Committee,  ITC-India 2017
Bangalore, Karnataka, India
Email: navin.bishnoi@globalfoundries.com