Call For Papers

Authors are invited to submit original, unpublished papers describing recent work in the field of test and design. In addition, authors are invited to submit high quality, practical, industry best practices. Submissions simultaneously under review or accepted by another conference, symposium or journal, will be summarily rejected.

Title of paper.
Name, affiliation, e-mail address of each author.
The corresponding author(s). ITC India will communicate with the corresponding author(s).
One or two topic(s) from the topic list, or a description of your topic.
An electronic copy of a complete paper up to 10 pages, or an extended summary up to 6 pages. Submissions less than 4 pages are rarely accepted.
An abstract of 35 words or less to be entered online.

IMPORTANT DATES

Paper Submission deadline : April 14, 2019
Author Notification : May 17, 2019
Final Manuscript Due : June 14, 2019

ITC India invites submissions on the latest advances in test, validation and diagnosis of ICs, boards and systems.

Topics of interest include (not limited to):

3D/2.5D Test

Adaptive Test in Practice

ATE/Probe Card Design

Advances in Boundary Scan

Bring Up

Data Driven Methods

Data Exchange and Infrastructure

Defect-Oriented Testing

DFM and Test Diagnosis

Economics of Test

End-to- End Data Analysis

Embedded BIST & DFT

Emerging Defect Mechanisms

Hardware Security and Trust

IoT Testing

Known-Good- Die testing

Memory Test and Repair

MEMS Testing

Mixed-Signal and Analog Test

New Technologies and Test

On-Chip Test Compression

Online Test

Pre & Post- Silicon Validation

Power Issues in Test

Protocol-aware Test

Reliability and Resilience

Scan Based Test

SoC/SiP/NoC Test

Silicon Debug

Jitter, High-Speed I/O & RF Test

Simulation and Test

System Test (Applications)

System Test (Hardware/Software)

Test-to- Design Feedback

Test Escape Analysis

Test Flow Optimizations

Test Generation and Validation

Test Resource Partitioning

Test Standards

Test Time Analysis and Reduction

Testing High Speed Optics/Photonics

Timing Test

Yield Analysis and Optimization

For detailed information about the submission process, requirements and deadlines, the selection process and any other questions regarding the program itself or contact information, please consult the ITC India web site at http://www.itctestweekindia.org or email the program chair at itc-india-tpc@googlegroups.com